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manufacturing-ai

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Industrial computer vision workflow for welding defect inspection using YOLO, OpenCV preprocessing, dataset QA, threshold governance, and edge-readiness analysis.

  • Updated May 1, 2026
  • Jupyter Notebook

Research-driven wafer defect classification framework combining classical ML and CNN-based approaches, with experimental analysis of few-shot learning under severe class imbalance and limited data regimes.

  • Updated Jun 26, 2026
  • Jupyter Notebook

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