v25.5.0

• Added

  • Instrument Abstraction
    • New MergePinGroup and UnmergePinGroup DCPower methods added for merging and unmerging channels within a pin group to output higher current. Only supported with multichannel SMUs that support the NI-DCPower Merged Channels driver feature, such as the PXIe-4147, PXIe-4162, and PXIe-4163 devices. Refer to the updated documentation for details.
      • MergePinGroup(string mergedChannelsPinGroupName)
      • MergePinGroup(string[] mergedChannelsPinGroupNames)
      • UnmergePinGroup(string mergedChannelsPinGroupName)
      • UnmergePinGroup(string[] mergedChannelsPinGroupNames)
    • New interfaces and classes added to support Custom Instruments defined the Pin Map, including extension methods in TSMSessionManager to create a new CustomInstrumentSessionsBundle object for Custom Instruments. Refer to the updated documentation for details.
      • ICustomInstrument
      • ICustomInstrumentFactory
      • InitializeAndClose
      • CustomInstrumentSessionInformation
      • CustomInstrumentSessionsBundle
    • New support added for Shared Pins defined in the pin map.
      • Any pins mapping the same instrument channel to multiple sites are now handled by the instrument abstractions.
  • Common
    • Exception message improvements: site-pin context now provided when a NISemiconductorTestException is thrown.
      • New class ExceptionCollector added that collects multiple exceptions during driver operations and throws them as a single NISemiconductorTestException, preserving site-pin context.
      • Updated the ParallelExecution class, instrument abstractions classes, and data abstractions classes to make use of the new ExceptionCollector class.
    • New CloneSitePinInfo method added to the SitePinInfo class.
      • Creates a shallow copy of the current SitePinInfo instance and returns it as a new object.
    • New SkipOperations property added to the SitePinInfo class.
      • Returns true if operations should be skipped for the current site-pin pair, based on shared or cascading channel context.
  • Documentation & Examples
    • Various additions to examples and documentation in accordance with latest changes.
      • Reorganized examples into the following categories: Code Snippets, Sequence, Test Programs.
        • Examples from previous versions are categorized as code snippets beginning with this release.
        • Added documentation to explain the different example styles.
      • Added a Test Program style example demonstrating using STL to test a hypothetical Accelerometer DUT.
      • Added a Sequence style example and documentation for merging and unmerging of channels in pin groups.
      • Added a Sequence style example and documentation for Custom and third-party instrument support.
      • Added documentation for exception handling NISemiconductorTestException.
      • Added documentation for shared pin support.
      • Added documentation for best practices to write extension methods.

• Changed

  • Instrument Abstraction
    • Creating a DAQmxTaskBundle for a running AO task no longer results in an exception being thrown.
    • The DCPower ClearTriggers extension method no longer results in an exception being thrown with PXIe-4147 devices.
  • TestStandSteps
    • LeakageTest now publishes the correct value when the serialOperationEnabled parameter is set to true.
  • Documentation
    • Updated NuGet package documentation with information on how to verify the integrity of a NuGet package.